Test function:
1. Automatically detect NPN and PNP transistors, field effect transistors, diodes, double diodes, thyristors, thyristors, and thyristors, and automatically determine the pin distribution of the aforementioned transistors.
2. Test the amplification coefficient of the common emitter current of NPN and PNP transistors, the threshold voltage of the base emitter, and the leakage current of the collector emitter at the cut off time.
3. Identify Darlington triode by emitter threshold voltage and high current amplification coefficient of triode base.
4. Detect the built in protective diodes of power transistors and field effect transistors.
5. Test the gate source conduction threshold voltage, drain source conduction resistance, and gate source capacitance of a field-effect transistor.
6. A maximum of 2 resistors can be measured at a time, so adjustable resistors with three pins can also be measured. If the adjustable resistor is adjusted to the end point, only one resistance value can be measured.
7. The highest resolution for resistance measurement is 0.01 Ω. Can measure up to 50M Ω.
8. The measurement range of the capacitor ranges from 25pF to 100mF, with a resolution of 1pF.
9. For capacitors larger than 90nF, measure their equivalent series resistance ESR at the same time, and the maximum resolution of equivalent series resistance is 0.01 Ω.